1 January 2004 Linear birefringence in CaF2 measured at deep ultraviolet and visible wavelengths
Baoliang Bob Wang, Richard R. Rockwell, Jennifer List
Author Affiliations +
Abstract
We describe the application of a linear birefringence measurement system at the optical lithographic wavelengths (157, 193, and 248 nm). Using this instrument, we obtain linear birefringence maps of a variety of calcium fluoride samples with different crystal orientations and at different DUV (deep ultraviolet) wavelengths. Comparing the birefringence results measured at DUV and visible wavelengths, we find that some calcium fluoride samples show a strong correlation in birefringence measured at different wavelengths while others do not. Significant differences in birefringence patterns are observed at 157 and 633 nm for certain calcium fluoride samples when the light beam propagates along the [111] crystal axis. We explain the discrepancy in the birefringence patterns observed at 157 and 633 nm based on the crystalline structural quality of calcium fluoride samples.
©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)
Baoliang Bob Wang, Richard R. Rockwell, and Jennifer List "Linear birefringence in CaF2 measured at deep ultraviolet and visible wavelengths," Journal of Micro/Nanolithography, MEMS, and MOEMS 3(1), (1 January 2004). https://doi.org/10.1117/1.1631314
Published: 1 January 2004
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Birefringence

Crystals

Deep ultraviolet

Calcium

Laser crystals

Lithography

Light wave propagation

RELATED CONTENT


Back to Top