1 January 2005 Current status of optical maskless lithography
Author Affiliations +
Abstract
We review the current status of optical maskless lithography technology. The optical maskless systems presented in literature are either aimed for low-cost, large-feature, low-end production, or high-end performance directly competing with state of the art optical scanners. In the latter case, optical maskless systems are based on piston or tilting micromirror spatial light modulators (SLMs). Similar performance can be achieved with both mirror types, but tilting mirrors offer lower manufacturing complexity, the possibility of using larger mirrors, less complex rasterizing algorithms, and lower demands on the data path. This indicates that the tilting mirror arrangement might be more appealing for high-performance, high-capacity, economical optical maskless lithography. With the latest technology in SLM and rasterizing technology, an optical maskless tool can match regular mask-based scanners in all imaging modes at the 65-nm node, including binary, weak and strong phase-shifting, phase edge, and chromeless phase lithography. Optical maskless lithography can further provide an almost complete transparency with current lithography technology in terms of design rules, optical proximity correction (OPC) models, and illumination settings. Any difference is due not to the SLM, but to the reticle process and electromagnetic properties.
©(2005) Society of Photo-Optical Instrumentation Engineers (SPIE)
Hans Martinsson, Tor Sandstrom, Arno J. Bleeker, and Jason D. Hintersteiner "Current status of optical maskless lithography," Journal of Micro/Nanolithography, MEMS, and MOEMS 4(1), 011003 (1 January 2005). https://doi.org/10.1117/1.1862649
Published: 1 January 2005
Lens.org Logo
CITATIONS
Cited by 34 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Spatial light modulators

Reticles

Maskless lithography

Photomasks

Semiconducting wafers

Scanners

RELATED CONTENT

Pixel-based data preparation for digital scanner
Proceedings of SPIE (September 29 2023)
EUV high NA scanner and mask optimization for sub 8nm...
Proceedings of SPIE (March 18 2016)
RET for optical maskless lithography
Proceedings of SPIE (May 28 2004)
High-numerical-aperture 193-nm exposure tool
Proceedings of SPIE (September 14 2001)

Back to Top