1 January 2005 Status of 157-nm optical lithography
Author Affiliations +
Abstract
This paper describes the status of 157-nm lithography in mid 2004. With the rapid rise of 193-nm immersion from a potential concept in early 2002 at SPIE, through its development, to scheduled delivery of early production tools in late 2004 and early 2005, 157-nm lithography has taken a backseat in the development of optical lithographic technology. While significant challenges were conquered during the 2000 through 2002 period, the development was too slow to prevent 157-nm from being eclipsed by 193-nm immersion. This work reviews the challenges that were identified and conquered during the development of 157-nm lithography. The jury is still out on potential application to production lithography, although the main development effort has been seriously scaled back. There are still issues that remain to be solved before the technology could evolve into a full manufacturing system. The answer to the question of whether it will evolve or not is left to the future to answer.
©(2005) Society of Photo-Optical Instrumentation Engineers (SPIE)
Walter J. Trybula "Status of 157-nm optical lithography," Journal of Micro/Nanolithography, MEMS, and MOEMS 4(1), 011007 (1 January 2005). https://doi.org/10.1117/1.1860401
Published: 1 January 2005
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Lithography

Birefringence

Optical lithography

Crystals

Optics manufacturing

Manufacturing

Photomasks

RELATED CONTENT

157-nm lithography program at International SEMATECH
Proceedings of SPIE (August 01 2002)
New silica glass (AQF) for 157-nm lithography
Proceedings of SPIE (July 05 2000)
157-nm technology: Where are we today?
Proceedings of SPIE (July 30 2002)
Sol-gel fabrication of high-quality photomask substrates
Proceedings of SPIE (December 27 2002)

Back to Top