Articles

Fabrication and measurement of wideband achromatic waveplates for the mid-infrared region using subwavelength features

[+] Author Affiliations
Robert R. Boye, Shanalyn A. Kemme, Joel R. Wendt, Alvaro A. Cruz-Cabrera, G. A. Vawter

Sandia National Laboratories, PO Box 5800, MS 1082, Albuquerque, New Mexico 87185-1082

Charles R. Alford, Tony R. Carter, Sally Samora

L & M Technologies Inc., Albuquerque, New Mexico 87123

J. Micro/Nanolith. MEMS MOEMS. 5(4), 043007 (November 27, 2006). doi:10.1117/1.2397081
History: Received August 03, 2006; Revised August 29, 2006; Accepted August 31, 2006; Published November 27, 2006
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Subwavelength diffractive features etched into a substrate lead to form birefringence that can produce polarization sensitive elements such as wave plates. Using etched features allows for the development of pixelated devices to be used in conjunction with focal plane arrays in polarimetric imaging systems. Form birefringence exhibits dispersion that can be advantageous to the design of wave plates with an achromatic response. Taking advantage of this dispersion, diffractive wave plates with good achromatic characteristics can be designed for the 2-to5-μm spectral region. Previous work in this area has produced good results over a subset of this wavelength band, but designing for this extended band is particularly challenging. The fabrication processes for the subwavelength features will be discussed and fabricated devices with a measured average phase retardation of 80.6deg and rms variation of 9.41deg will be presented.

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© 2006 Society of Photo-Optical Instrumentation Engineers

Citation

Robert R. Boye ; Shanalyn A. Kemme ; Joel R. Wendt ; Alvaro A. Cruz-Cabrera ; G. A. Vawter, et al.
"Fabrication and measurement of wideband achromatic waveplates for the mid-infrared region using subwavelength features", J. Micro/Nanolith. MEMS MOEMS. 5(4), 043007 (November 27, 2006). ; http://dx.doi.org/10.1117/1.2397081


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