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Fabrication and testing of finite aperture polarizers for determination of edge termination effects on polarimetric imaging applications at midwave infrared

[+] Author Affiliations
Alvaro A. Cruz-Cabrera, Shanalyn A. Kemme, Joel R. Wendt, Robert R. Boye

Sandia National Laboratories, Photonic Microsystem Technologies, PO Box 5800, MS 1082, Albuquerque, New Mexico 87185

Tony R. Carter, Sally Samora

L&M Technologies, 1515 Eubank SE, Albuquerque, New Mexico 87123

J. Micro/Nanolith. MEMS MOEMS. 7(1), 013013 (February 15, 2008). doi:10.1117/1.2842375
History: Received February 16, 2007; Revised August 23, 2007; Accepted October 15, 2007; Published February 15, 2008
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Polarimetric imaging applications at the 2to5μm or midwave infrared range use large pixel-count focal plane arrays (FPAs) with small pixel sizes. We report on the design, fabrication, and characterization of micropolarizers for the 2to5μm regime. These micropolarizers will be used in conjunction with a FPA and will be in the near field of the imaging device. The pixel pitches for some commercial FPAs are small enough that the finite apertures of the polarizing devices may significantly affect their performance, because their aperture dimension varies between three and five waves. We are interested in understanding the effect on the extinction ratio due to variations in the edge terminations of a polarizer with a small aperture. Edge terminations are the spaces between the first and last wire with the perimeter of the aperture of the polarizer. To verify these effects, we fabricated micropolarizers with apertures of 5 to 20μm and with termination edge spaces of one-quarter and three-quarters of the wiregrids period. The devices measured extinction ratios from 50:1 for the smallest aperture to 200:1 for the largest. Simulations and measurements show that the extinction ratio is larger for the smaller termination edge spacing.

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© 2008 Society of Photo-Optical Instrumentation Engineers

Citation

Alvaro A. Cruz-Cabrera ; Shanalyn A. Kemme ; Joel R. Wendt ; Robert R. Boye ; Tony R. Carter, et al.
"Fabrication and testing of finite aperture polarizers for determination of edge termination effects on polarimetric imaging applications at midwave infrared", J. Micro/Nanolith. MEMS MOEMS. 7(1), 013013 (February 15, 2008). ; http://dx.doi.org/10.1117/1.2842375


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