13 September 2012 Cleaning induced imprint template erosion
SherJang Singh, Zhaoning Yu, Nobuo Kurataka, Gene Gauzner, Hongying Wang, Henry H. Yang, Yautzong E. Hsu, Kim Y. Lee, David S. Kuo, Tobias Wähler, Peter Dress
Author Affiliations +
Abstract
We studied the erosion and feature stability of fused silica patterns under different template cleaning conditions. The conventional sulfuric acid and hydrogen peroxide mixture (SPM) cleaning is compared with an advanced nonacid process. Spectroscopic ellipsometry optical critical dimension measurements were used to characterize the changes in pattern profile with good sensitivity. This study confirmed the erosion of the silica patterns in the traditional acid-based SPM cleaning mixture (H2SO4+H2O2) at a rate of ~ 0.1 nm per cleaning cycle. However, the advanced nonacid cleaning process only showed critical dimension shift of ~ 0.01 nm per cleaning. Contamination removal and pattern integrity of sensitive 20-nm features under MegaSonic assisted cleaning was also demonstrated.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2012/$25.00 © 2012 SPIE
SherJang Singh, Zhaoning Yu, Nobuo Kurataka, Gene Gauzner, Hongying Wang, Henry H. Yang, Yautzong E. Hsu, Kim Y. Lee, David S. Kuo, Tobias Wähler, and Peter Dress "Cleaning induced imprint template erosion," Journal of Micro/Nanolithography, MEMS, and MOEMS 11(3), 031407 (13 September 2012). https://doi.org/10.1117/1.JMM.11.3.031407
Published: 13 September 2012
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Beam propagation method

Scanning probe microscopy

Contamination

Scanning electron microscopy

Silica

Inspection

Nanoimprint lithography

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