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Measurement of the gauge factor of few-layer graphene

[+] Author Affiliations
Xiaohu Zheng

Huaiyin Institute of Technology, Huaian 223003, China

Xing Chen, Ji-Kwan Kim, Dong-Weon Lee

Chonnam National University, School of Mechanical Systems Engineering, Gwangju, Republic of Korea

Xinxin Li

Chinese Academy of Sciences, State Key Laboratory of Tranducer Technology, Shanghai 200050, China

J. Micro/Nanolith. MEMS MOEMS. 12(1), 013009 (Feb 11, 2013). doi:10.1117/1.JMM.12.1.013009
History: Received May 15, 2012; Revised January 7, 2013; Accepted January 23, 2013
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Abstract.  Graphene, one of the recently discovered carbon nanostructures, has shown good piezoresistive properties. One of the most important areas of research for graphene sheets, in terms of basic science and application in strain or stress sensors, is the measurement of gauge factors. The gauge factors of various layers of graphene sheets are measured based on the equivalent stress beam. The measurement is carried out using a beam-bending method to detect the change in resistance of graphene sheets in different bending states. The gauge factor ranges from 10 to 15, depending on the number of layers in the graphene sheet. These results reveal the piezoresistance effect of single- and multi-layer graphene sheets, which will be of benefit in the fabrication of microsensors. The resistance of graphene sheets decreases as temperature increases from 20°C to 60°C, and the gauge factor is not very sensitive to changes in environmental temperature.

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© 2013 Society of Photo-Optical Instrumentation Engineers

Topics

Graphene ; Resistance

Citation

Xiaohu Zheng ; Xing Chen ; Ji-Kwan Kim ; Dong-Weon Lee and Xinxin Li
"Measurement of the gauge factor of few-layer graphene", J. Micro/Nanolith. MEMS MOEMS. 12(1), 013009 (Feb 11, 2013). ; http://dx.doi.org/10.1117/1.JMM.12.1.013009


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