Special Section on Emerging MOEMS Technology and Applications

Three-dimensional profiling using a still shot

[+] Author Affiliations
Mahesh Kondiparthi

Indian Institute of Science, Department of Instrumentation and Applied Physics, Bangalore 560012, India

J. Micro/Nanolith. MEMS MOEMS. 13(1), 011106 (Dec 02, 2013). doi:10.1117/1.JMM.13.1.011106
History: Received June 1, 2013; Revised October 5, 2013; Accepted October 16, 2013
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Abstract.  A method to reliably extract object profiles even with surface discontinuities that leads to 2nπ phase jumps is proposed. The proposed method uses an amplitude-modulated Ronchi grating, which allows one to extract phase and unwrap the same with a single image. Ronchi equivalent image can be derived from modified grating image, which aids in extracting wrapped phase using Fourier transform profilometry. The amplitude of the modified grating aids in phase unwrapping. As we only need a projector that projects an amplitude-modulated grating, the proposed method allows one to extract three-dimensional profile without using full video projectors. This article also deals with noise reduction algorithms for fringe projection techniques.

© 2014 Society of Photo-Optical Instrumentation Engineers

Citation

Mahesh Kondiparthi
"Three-dimensional profiling using a still shot", J. Micro/Nanolith. MEMS MOEMS. 13(1), 011106 (Dec 02, 2013). ; http://dx.doi.org/10.1117/1.JMM.13.1.011106


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