Three-dimensional profiling using a still shot

Mahesh Kondiparthi

doi:10.1117/1.JMM.13.1.011106

2 December 2013 Three-dimensional profiling using a still shot

Mahesh Kondiparthi

Journal of Micro/Nanolithography, MEMS, and MOEMS, Vol. 13, Issue 1, 011106 (December 2013). https://doi.org/10.1117/1.JMM.13.1.011106

Abstract

A method to reliably extract object profiles even with surface discontinuities that leads to 2_nπ phase jumps is proposed. The proposed method uses an amplitude-modulated Ronchi grating, which allows one to extract phase and unwrap the same with a single image. Ronchi equivalent image can be derived from modified grating image, which aids in extracting wrapped phase using Fourier transform profilometry. The amplitude of the modified grating aids in phase unwrapping. As we only need a projector that projects an amplitude-modulated grating, the proposed method allows one to extract three-dimensional profile without using full video projectors. This article also deals with noise reduction algorithms for fringe projection techniques.

Citation Download Citation

Mahesh Kondiparthi "Three-dimensional profiling using a still shot," Journal of Micro/Nanolithography, MEMS, and MOEMS 13(1), 011106 (2 December 2013). https://doi.org/10.1117/1.JMM.13.1.011106

Published: 2 December 2013

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