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Micromotion-induced dynamic effects from a neural probe and brain tissue interface

[+] Author Affiliations
Michael Polanco

Old Dominion University, Department of Mechanical and Aerospace Engineering, Norfolk, Virginia 23529

Hargsoon Yoon

Norfolk State University, Electronics Engineering, Norfolk, Virginia 23504

Sebastian Bawab

Old Dominion University, Department of Mechanical and Aerospace Engineering, Norfolk, Virginia 23529

J. Micro/Nanolith. MEMS MOEMS. 13(2), 023009 (Jun 11, 2014). doi:10.1117/1.JMM.13.2.023009
History: Received December 5, 2013; Revised May 12, 2014; Accepted May 15, 2014
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Abstract.  Neural probes contain the potential to cause injury to surrounding neural cells due to a discrepancy in stiffness values between them and the surrounding brain tissue when subjected to mechanical micromotion of the brain. To evaluate the effects of the mechanical mismatch, a series of dynamic simulations are conducted to better understand the design enhancements required to improve the feasibility of the neuron probe. The simulations use a nonlinear transient explicit finite element code, LS-DYNA. A three-dimensional quarter-symmetry finite element model is utilized for the transient analysis to capture the time-dependent dynamic deformations on the brain tissue from the implant as a function of different frequency shapes and stiffness values. When micromotion-induced pulses are applied, reducing the neuron probe stiffness by three orders of magnitude leads up to a 41.6% reduction in stress and 39.1% reduction in strain. The simulation conditions assume a case where sheath bonding has begun to take place around the probe implantation site, but no full bond to the probe has occurred. The analyses can provide guidance on the materials necessary to design a probe for injury reduction.

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© 2014 Society of Photo-Optical Instrumentation Engineers

Topics

Brain ; Interfaces ; Tissues

Citation

Michael Polanco ; Hargsoon Yoon and Sebastian Bawab
"Micromotion-induced dynamic effects from a neural probe and brain tissue interface", J. Micro/Nanolith. MEMS MOEMS. 13(2), 023009 (Jun 11, 2014). ; http://dx.doi.org/10.1117/1.JMM.13.2.023009


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