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Electrostatic stiffness correction for quadrature error in decoupled dual-mass MEMS gyroscope

[+] Author Affiliations
Hongsheng Li

Southeast University, School of Instrument Science and Engineering, Key Laboratory of Micro Inertial Instrument and Advanced Navigation Technology of Ministry of Education, Nanjing 210096, China

Huiliang Cao

Southeast University, School of Instrument Science and Engineering, Key Laboratory of Micro Inertial Instrument and Advanced Navigation Technology of Ministry of Education, Nanjing 210096, China

Yunfang Ni

Southeast University, School of Instrument Science and Engineering, Key Laboratory of Micro Inertial Instrument and Advanced Navigation Technology of Ministry of Education, Nanjing 210096, China

J. Micro/Nanolith. MEMS MOEMS. 13(3), 033003 (Jul 14, 2014). doi:10.1117/1.JMM.13.3.033003
History: Received April 18, 2014; Revised June 10, 2014; Accepted June 11, 2014
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Abstract.  This paper proposes an electrostatic stiffness correction method for the quadrature error (QUER) in a decoupled dual-mass gyroscope structure. The QUER is caused by the imperfections during the structure manufacturing process, and the two masses usually have different QUERs. The harm contribution to the Coriolis signal is analyzed and quantified. The generating forms of QUER motion in both masses are analyzed, the correction electrodes’ working principle is introduced, and a single mass individual correction method is proposed. The QUER stiffness correction system is designed based on a PI controller, and the experiments are arranged to verify the theoretical analysis. The bias stability decreases from 2.06 to 0.64deg/h after the QUER correction, and the parameters of scale factor such as nonlinearly, asymmetry, and repeatability, reduce from 143, 557, and 210 ppm to 84, 242, and 175 ppm, respectively.

© 2014 Society of Photo-Optical Instrumentation Engineers

Citation

Hongsheng Li ; Huiliang Cao and Yunfang Ni
"Electrostatic stiffness correction for quadrature error in decoupled dual-mass MEMS gyroscope", J. Micro/Nanolith. MEMS MOEMS. 13(3), 033003 (Jul 14, 2014). ; http://dx.doi.org/10.1117/1.JMM.13.3.033003


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