5 February 2016 Development of nanoimprint lithography templates toward high-volume manufacturing
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Abstract
Development of nanoimprint lithography (NIL) templates is discussed. The template fabrication process and its performance are presented with consideration of the requirements of NIL for high-volume manufacturing. Defectivity, image placement, and critical dimension uniformity are the three major performance parameters of the templates, and their current status is shown.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE) 1932-5150/2016/$25.00 © 2016 SPIE
Koji Ichimura, Kouji Yoshida, Saburo Harada, Takaharu Nagai, Masaaki Kurihara, and Naoya Hayashi "Development of nanoimprint lithography templates toward high-volume manufacturing," Journal of Micro/Nanolithography, MEMS, and MOEMS 15(2), 021006 (5 February 2016). https://doi.org/10.1117/1.JMM.15.2.021006
Published: 5 February 2016
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Nanoimprint lithography

High volume manufacturing

Image processing

Critical dimension metrology

Lithography

Semiconducting wafers

Semiconductors

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