Paper
22 September 1987 Single Mode Conversion In Four-Layer Electrooptical Waveguides
F. Canal, J. Hernandez
Author Affiliations +
Proceedings Volume 0800, Novel Optoelectronic Devices; (1987) https://doi.org/10.1117/12.941189
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
Abstract
Propagation modes in four-layer electrooptical waveguides, single mode conversion conditions, have been studied as a function of the electrooptic coefficients and the active and intermediate layer's thickness.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Canal and J. Hernandez "Single Mode Conversion In Four-Layer Electrooptical Waveguides", Proc. SPIE 0800, Novel Optoelectronic Devices, (22 September 1987); https://doi.org/10.1117/12.941189
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KEYWORDS
Waveguides

Electro optics

Wave propagation

Refractive index

Optoelectronic devices

Lithium

Niobium

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