Paper
18 May 1988 The Commercialization Of Engineered Diamond Technology
M. Peters, J M Pinneo, L S Plano, K V Ravi, V Versteeg, S Yokota
Author Affiliations +
Proceedings Volume 0877, Micro-Optoelectronic Materials; (1988) https://doi.org/10.1117/12.943943
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States
Abstract
Some of the commercial aspects of thin diamond films deposited by plasma enhanced chemical vapor deposition are reviewed. Diamond films deposited by the use of DC bias have been characterized by using a variety of techniques including Raman spectroscopy and scanning electron microscopy. The relationship between deposition conditions and film characteristics are discussed.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Peters, J M Pinneo, L S Plano, K V Ravi, V Versteeg, and S Yokota "The Commercialization Of Engineered Diamond Technology", Proc. SPIE 0877, Micro-Optoelectronic Materials, (18 May 1988); https://doi.org/10.1117/12.943943
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Cited by 4 scholarly publications.
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KEYWORDS
Diamond

Raman spectroscopy

Thin films

Plasma enhanced chemical vapor deposition

Crystals

Silicon

Carbon

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