Prism alignment using a point source microscope

Robert E. Parks

doi:10.1117/12.2526534

30 August 2019 Prism alignment using a point source microscope

Robert E. Parks

Proceedings Volume 11103, Optical Modeling and System Alignment; 1110303 (2019) https://doi.org/10.1117/12.2526534
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The Point Source Microscope (PSM) is used to locate the apex of retroreflecting prisms in 3 degrees of translational freedom with a precision of less than 1 micron. The process is easily explained for right angle prisms, as will be done in this paper, but the explanation is valid for cube corner retroreflectors such as those mounted in spherical balls, spherically mounted retroreflectors, or SMRs, for use with laser trackers. With suitable, simple fixturing, the measurements for all 3 directions are made to a precision of < 1 μm in less than 1 minute.

Citation Download Citation

Robert E. Parks "Prism alignment using a point source microscope", Proc. SPIE 11103, Optical Modeling and System Alignment, 1110303 (30 August 2019); https://doi.org/10.1117/12.2526534

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