Simulation for the effects of optical aberrations on the depletion patterns of STED microscopy using Zernike polynomials

Xiaogang Chen; Jun Wei; Youping Huang; Hao Zhang

doi:10.1117/12.2653340

15 December 2022 Simulation for the effects of optical aberrations on the depletion patterns of STED microscopy using Zernike polynomials

Xiaogang Chen, Jun Wei, Youping Huang, Hao Zhang

Author Affiliations +

Proceedings Volume 12478, Thirteenth International Conference on Information Optics and Photonics (CIOP 2022); 124781J (2022) https://doi.org/10.1117/12.2653340
Event: Thirteenth International Conference on Information Optics and Photonics (CIOP 2022), 2022, Xi'an, China

Abstract

Stimulated emission depletion (STED) microscopy had greatly enhanced our ability to explore the microscopic world, which can provide sub-diffraction resolution. The high resolution of STED depends on the shape of the depletion patterns with the center is a null intensity. Optical aberrations were the most important factor which affects the shape of the depletion patterns. In this paper, the influences of aberrations modes on the performance of depletion patterns in STED microscopy were studied by numerical simulation and experiment using Zernike polynomials. Simulation results show that the coma, trefoil, astigmatism and spherical had the largest effect on depletion patterns. Also, distortion and blurring of the image will increase with multiple wavefront aberrations. Finally, the simulation results are verified by experiments based on space light modulator (SLM). The study provides a scientific basis for designing a STED system, and has important guiding significance in both theory and practice.

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Xiaogang Chen, Jun Wei, Youping Huang, and Hao Zhang "Simulation for the effects of optical aberrations on the depletion patterns of STED microscopy using Zernike polynomials", Proc. SPIE 12478, Thirteenth International Conference on Information Optics and Photonics (CIOP 2022), 124781J (15 December 2022); https://doi.org/10.1117/12.2653340

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KEYWORDS

Stimulated emission depletion microscopy

Microscopy

Neodymium

Monochromatic aberrations

Zernike polynomials

Beam shaping

Wavefront aberrations

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