Poster + Paper
26 November 2023 Curing analysis of room temperature silicone rubber based on terahertz time-domain spectroscopy system
Jing Xu, Zhenwei Zhang, Yuejin Zhao
Author Affiliations +
Conference Poster
Abstract
In high-voltage substations, flashover will occur along the surface of wet insulators under bad weather conditions, resulting in pollution flashover accidents of power system, which will seriously threaten the safe and stable operation of power system. Room Temperature Silicone Rubber (RTV), as a new technology and material, has been rapidly developed and widely applied due to its outstanding characteristics such as long lasting and maintenance-free. However, its surface uniformity and defects in the curing process will affect the service life of the coating. In this paper, a terahertz time-domain spectroscopy system was used to analyze the defects, material parameters, thickness, and curing process of RTV coating. Firstly, RTV coating samples with different absences and different thicknesses were produced, and the imaging results of RTV coating prefabrication defects, the optical parameters of cured RTV in the terahertz band and the thickness of the samples were obtained by the terahertz spectroscopy system. In addition, the results of the optical parameters of the RTV material over time (experimental conditions: 20°C, 15%RH) were verified by the experiment over a 3 h period. Different methods were used to extract the optical parameters of the materials for comparison. The results obtained in this paper provide a theoretical model for the application of terahertz time-domain spectroscopy in the nondestructive testing of RTV coating in power systems, and can realize the lifetime analysis of RTV coating.
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Jing Xu, Zhenwei Zhang, and Yuejin Zhao "Curing analysis of room temperature silicone rubber based on terahertz time-domain spectroscopy system", Proc. SPIE 12776, Infrared, Millimeter-Wave, and Terahertz Technologies X, 127760V (26 November 2023); https://doi.org/10.1117/12.2687271
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KEYWORDS
Coating

Terahertz spectroscopy

Coating thickness

Refractive index

Terahertz radiation

Terahertz technology

Dielectrics

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