Research and testing on enterprise NVMe SSD reliability technology

Hong Fei Qui; Zhiqin Huang; Pengcheng Jiang

doi:10.1117/12.3010432

20 October 2023 Research and testing on enterprise NVMe SSD reliability technology

Hong Fei Qui, Zhiqin Huang, Pengcheng Jiang

Proceedings Volume 12814, Third International Conference on Green Communication, Network, and Internet of Things (CNIoT 2023); 1281425 (2023) https://doi.org/10.1117/12.3010432
Event: Third International Conference on Green Communication, Network, and Internet of Things (CNIoT 2023), 2023, Chongqing, China

Abstract

Garbage collection mechanism may cause system delay, Trim is a specific command for SSD to minimise the data volume of garbage collection, Trim function enhances SSD performance and extend SSD life. However Trim operation has impact on ordinary read-write IO delay, lead to business system delay and even system error. As to this issue, study on working schema of enterprise SSD trim, establish technical requirements for SSD testing workload model and QoS. Build up reliable testing plan on workload model, and adopt FIO tool to perform testing. The result shows such plan can conduct quantitative evaluation on SSD reliability scientifically and reasonably, assists the enterprises to choose credible SSD.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Hong Fei Qui, Zhiqin Huang, and Pengcheng Jiang "Research and testing on enterprise NVMe SSD reliability technology", Proc. SPIE 12814, Third International Conference on Green Communication, Network, and Internet of Things (CNIoT 2023), 1281425 (20 October 2023); https://doi.org/10.1117/12.3010432

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