Abstract
This paper provides an overview of the current state-of-the-art HYMOSS (Hybrid Mosaic On Stacked Silicon) Z-technology. In the first part of this paper, an introduction to the HYMOSS physical characteristics is presented. This includes a description of the stacked substrates (cube) and mounting hardware (module). The basic steps in manufacturing HYMOSS are covered. The paper concludes with a description of the two newest endeavors for HYMOSS technology: stacking of superconducting ICs, digital memory, and processor ICs.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David E. Ludwig "Current HYMOSS Z-technology overview", Proc. SPIE 1339, Materials, Devices, Techniques, and Applications for Z-Plane Focal Plane Array Technology II, (1 November 1990); https://doi.org/10.1117/12.23017
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Superconductors

Packaging

Sensors

Semiconducting wafers

Staring arrays

Silicon

Ceramics

RELATED CONTENT

Uncooled infrared sensor development trends and challenges
Proceedings of SPIE (September 16 2011)
Recent Advances In Z-Technology Architecture
Proceedings of SPIE (September 13 1989)
MEMS sensor packaging using LTCC substrate technology
Proceedings of SPIE (November 21 2001)
Packaging of electronics for on and off FPA signal...
Proceedings of SPIE (November 01 1990)

Back to Top