Time-resolved techniques: an overview

Bennett C. Larson; J. Z. Tischler

doi:10.1117/12.23305

1 January 1991 Time-resolved techniques: an overview

Bennett C. Larson, J. Z. Tischler

Proceedings Volume 1345, Advanced X-Ray/EUV Radiation Sources and Applications; (1991) https://doi.org/10.1117/12.23305
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

Techniques for time-resolved X-ray scattering on time scales varying from kiloseconds to picoseconds are reviewed. It is concluded that the pulsed time structure and the high photon fluxes available from synchrotron X-ray sources provide new opportunities for time-resolved X-ray scattering investigations. Synchrotron beams typically consist of subnanosecond pulses of X-rays separated in time by a few tens of nanoseconds to a few hundred nanoseconds so that these beams appear as continuous X-ray sources for investigations of phenomena on time scales ranging from hours down to microseconds. Studies requiring time-resolution in the microsecond range can be carried out in a triggering mode by stimulating the phenomenon under consideration in coincidence with the X-ray pulses. Time resolution on the picosecond scale can be achieved through streak camera techniques in which the time structure of the individual X-ray pulses are viewed as quasi-continuous sources with about 100-200 picoseconds duration.

Citation Download Citation

Bennett C. Larson and J. Z. Tischler "Time-resolved techniques: an overview", Proc. SPIE 1345, Advanced X-Ray/EUV Radiation Sources and Applications, (1 January 1991); https://doi.org/10.1117/12.23305

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