Precision polarimetry of optical components (Invited Paper)

Russell A. Chipman

doi:10.1117/12.132140

20 October 1992 Precision polarimetry of optical components (Invited Paper)

Russell A. Chipman

Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132140
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan

Abstract

Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements are described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.

Citation Download Citation

Russell A. Chipman "Precision polarimetry of optical components (Invited Paper)", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); https://doi.org/10.1117/12.132140

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available