Paper
23 November 1992 Instrumentation for strain measurements using cylindrically bent perfect crystals
Petr Lukas, Miroslav Vrana, Pavel Mikula, Jiri Kulda
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Abstract
Experimental tests of elastically bent Si crystals as monochromator and analyzer in a triple- axis setup for investigation of stress fields in polycrystalline materials are presented. It is also demonstrated that if certain focusing conditions for a bent monochromator are met the beam diffracted by a polycrystalline sample becomes quasi-parallel which enables high resolution measurements directly with a PSD without the use of a collimator or a crystal-analyzer. In the three axis setup maximum sensitivity in determination of (Delta) d/d <EQ 10-4 can be achieved permitting profile-broadening analysis for reasonable sample volumes and counting times.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Petr Lukas, Miroslav Vrana, Pavel Mikula, and Jiri Kulda "Instrumentation for strain measurements using cylindrically bent perfect crystals", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130654
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Crystals

Diffraction

Monochromators

Statistical analysis

Fabry–Perot interferometers

Optical components

Silicon

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