Paper
22 October 1993 High-speed high-resolution fine wire diameter measurement system
Marcelo Ferreira Guimaraes, Theodore D. Doiron
Author Affiliations +
Proceedings Volume 2066, Industrial Optical Sensing and Metrology: Applications and Integration; (1993) https://doi.org/10.1117/12.162100
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
A fine wire diameter measurement system, for on-line monitoring, has been proposed by using a Machine Vision System and a visible diode laser. The system uses the Fraunhofer diffraction principle. The diffraction pattern, generated by a small wire exposed to a collimated laser beam, is acquired by a CCD industrial camera that is connected to a processing board inside a PC computer. Two different methods of measuring the diameters, static and dynamic, have been proposed in order to get high precision and high measurement rate. Wires with diameter from 10 to 350 micrometers have been measured by this system with 0.06% resolution. The accuracy is less than +/- 0.5% over a range of 90 - 350 micrometers diameter. For thinner wires, the measurement system should be calibrated to eliminate the systematic errors. The estimate random errors are +/- 0.25%. The instrument can measure the wire diameter at a 1000 Hz rate and allows it to move laterally in a 1 mm square window, maintaining the above accuracy. The system is compact and there are no moving parts.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcelo Ferreira Guimaraes and Theodore D. Doiron "High-speed high-resolution fine wire diameter measurement system", Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); https://doi.org/10.1117/12.162100
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffraction

Charge-coupled devices

Prototyping

Cameras

CCD cameras

Semiconductor lasers

Metrology

RELATED CONTENT

The Modular Charge-Coupled Device (CCD) Camera
Proceedings of SPIE (December 12 1979)
Use of CCD arrays versus PSD detectors in an optical...
Proceedings of SPIE (September 18 1996)
A Very Compact Real Time 3 D Range Sensor For...
Proceedings of SPIE (March 10 1989)

Back to Top