Dielectric properties of thin-film SrTiO3 grown on LaAlO3 with YBa2Cu3O7-x electrodes

Huey-Daw Wu; Frank S. Barnes; David Galt; John C. Price; James A. Beall

doi:10.1117/12.166149

4 January 1994 Dielectric properties of thin-film SrTiO₃ grown on LaAlO₃ with YBa₂Cu₃O_7-x electrodes

Huey-Daw Wu, Frank S. Barnes, David Galt, John C. Price, James A. Beall

Proceedings Volume 2156, High Tc Microwave Superconductors and Applications; (1994) https://doi.org/10.1117/12.166149
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

We have fabricated and characterized YBCO (YBa₂Cu₃O_7-x) microstrip resonators on LAO (LaAlO₃) substrates that include thin film STO (SrTiO₃) coplanar capacitors to study the dielectric properties of thin film STO. The low frequency capacitance of the STO/LAO capacitor is measured as a function of temperature and dc bias. We use the observed resonant frequencies to extract the microwave frequency capacitance of the structure and the Qs to determine the microwave losses. A conformal map is developed and used to transform the observed capacitances into dielectric constant values for the thin film STO.

Citation Download Citation

Huey-Daw Wu, Frank S. Barnes, David Galt, John C. Price, and James A. Beall "Dielectric properties of thin-film SrTiO₃ grown on LaAlO₃ with YBa₂Cu₃O_7-x electrodes", Proc. SPIE 2156, High Tc Microwave Superconductors and Applications, (4 January 1994); https://doi.org/10.1117/12.166149

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