Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction

V. M. Rubish; I. Yurkin; V. Malesh; Vassyl' Fedelesh; M. L. Trunov; D. Semak

doi:10.1117/12.226221

3 November 1995 Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction

V. M. Rubish, I. Yurkin, V. Malesh, Vassyl' Fedelesh, M. L. Trunov, D. Semak

Author Affiliations +

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226221
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

By the methods of Raman spectroscopy and x ray diffraction we studied the short-range order structure of binary and ternary glassy alloys in As(Sb)-S(Se)-I systems. The types of bonds and main structural parameters are defined. On the basis of the obtained results the model of 'microheterogeneous' glass structure was worked out.

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V. M. Rubish, I. Yurkin, V. Malesh, Vassyl' Fedelesh, M. L. Trunov, and D. Semak "Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226221

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