Objective Crystal Spectrometer (OXS) on the Spectrum-X-y satellite: crystal calibrations

Salim Abdali; Finn Erland Christensen; Herbert W. Schnopper; Leif Gerward; Hans-Joachim Wiebicke; Ingolf Halm; Eric Louis; Harm-Jan Voorma; Eberhard Adolf Spiller; Charles Tarrio

doi:10.1117/12.283779

15 October 1997 Objective Crystal Spectrometer (OXS) on the Spectrum-X-y satellite: crystal calibrations

Salim Abdali, Finn Erland Christensen, Herbert W. Schnopper, Leif Gerward, Hans-Joachim Wiebicke, Ingolf Halm, Eric Louis, Harm-Jan Voorma, Eberhard Adolf Spiller, Charles Tarrio

Author Affiliations +

Proceedings Volume 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII; (1997) https://doi.org/10.1117/12.283779
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The four kinds of crystals; RAP(001), Si(111), LiF(220) and the Co/C multilayer on the super polished Si(111) crystals, together make up the objective crystal spectrometer OXS. They cover a wide energy range extending from 0.16 eV to 8 keV. A study of crystal reflectivity and energy resolution including measurements on RAP, LiF and Co/C and a calculation of Si crystals in the respective wavelength bands has been performed and the results are presented.

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Salim Abdali, Finn Erland Christensen, Herbert W. Schnopper, Leif Gerward, Hans-Joachim Wiebicke, Ingolf Halm, Eric Louis, Harm-Jan Voorma, Eberhard Adolf Spiller, and Charles Tarrio "Objective Crystal Spectrometer (OXS) on the Spectrum-X-y satellite: crystal calibrations", Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, (15 October 1997); https://doi.org/10.1117/12.283779

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