Dielectric relaxation under constant-charge conditions

Ranko Richert; Hermann Wagner

doi:10.1117/12.276276

13 June 1997 Dielectric relaxation under constant-charge conditions

Ranko Richert, Hermann Wagner

Proceedings Volume 3181, Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications; (1997) https://doi.org/10.1117/12.276276
Event: Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications, 1996, Szczyrk, Poland

Abstract

The common technique of dielectric (epsilon) (t) measurements involves the application of a polarization invariant electric field to a capacitor filled with the material under study and the detection of the temporal evolution of the resulting current or charge flow. The counterpart condition of applying a given dielectric displacement and monitoring the electric field relates to the dielectric modulus M(t) with M((omega) ). Isothermal and thermally stimulated experimental techniques for directly accessing the relaxation M(t) are outlined and discussed as regards their relation to the dielectric retardation (epsilon) (t) and to dc-conductivity(sigma) _dc. We also address several microscopic processes which are inherently linked to the dielectric modulus through their common feature of displaying a redistribution of charge.

Citation Download Citation

Ranko Richert and Hermann Wagner "Dielectric relaxation under constant-charge conditions", Proc. SPIE 3181, Dielectric and Related Phenomena: Materials Physico-Chemistry, Spectrometric Investigations, and Applications, (13 June 1997); https://doi.org/10.1117/12.276276

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