Reliability assessment procedure of cryocoolers

Zvi Porat; A. Sne-Or; Nachman Pundak; D. Livni

doi:10.1117/12.328031

26 October 1998 Reliability assessment procedure of cryocoolers

Zvi Porat, A. Sne-Or, Nachman Pundak, D. Livni

Proceedings Volume 3436, Infrared Technology and Applications XXIV; (1998) https://doi.org/10.1117/12.328031
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The problem of assessing a product's reliability under limited data and knowledge is a common one. This article presents a reliability assessment algorithm, with application to cryocoolers, designed to handle such problems.

Citation Download Citation

Zvi Porat, A. Sne-Or, Nachman Pundak, and D. Livni "Reliability assessment procedure of cryocoolers", Proc. SPIE 3436, Infrared Technology and Applications XXIV, (26 October 1998); https://doi.org/10.1117/12.328031

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