In-situ noncontact nondestructive point-to-point microwave inspection system

Vasundara V. Varadan; Richard D. Hollinger; Anikumar R. Tellakula; K. A. Jose; Vijay K. Varadan

doi:10.1117/12.339951

4 February 1999 In-situ noncontact nondestructive point-to-point microwave inspection system

Vasundara V. Varadan, Richard D. Hollinger, Anikumar R. Tellakula, K. A. Jose, Vijay K. Varadan

Proceedings Volume 3589, Process Control and Sensors for Manufacturing II; (1999) https://doi.org/10.1117/12.339951
Event: Nondestructive Evaluation Techniques for Aging Infrastructures and Manufacturing, 1999, Newport Beach, CA, United States

Abstract

Discontinuities and manufacturing flaws affect system performance. The accurate location of flaws and defects is sometimes more important than its precise characterization. For mechanical structures, similarly sized flaws in certain locations are more critical than at other locations. Non- contact microwave inspection systems offer many advantages relative to traditional NDE techniques complex and nonplanar samples as well as composite or anisotropic materials, except where transmission through a metallic object is required. Using spot focused horn antennas, it is possible to detect, locate and identify the inhomogeneities inside dielectric materials with local resolution approaching one wavelength. The system can be completely automated under computer control. Inspection can be done purely in the reflect mode using only one antenna or in the transmission mode using two antennas. The antennas can move on a robotic arm or the system under inspection can move or rotate under the antenna. Surface profiling, shape profiling, and accurate non-contact thickness measurements can be performed in addition to locating flaws and delaminations. Inspection can be done in situ even in high temperature environments since this a non-contact method. Several different examples are presented to illustrate the efficacy of the method as an attractive, user friendly NDE tool.

Citation Download Citation

Vasundara V. Varadan, Richard D. Hollinger, Anikumar R. Tellakula, K. A. Jose, and Vijay K. Varadan "In-situ noncontact nondestructive point-to-point microwave inspection system", Proc. SPIE 3589, Process Control and Sensors for Manufacturing II, (4 February 1999); https://doi.org/10.1117/12.339951

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