Paper
21 April 2000 Image formation in near-field infrared microscopy
Dmitrii M. Simanovski, Daniel V. Palanker, Philip Huie, Todd I. Smith
Author Affiliations +
Abstract
In this paper we discuss the mechanisms of image formation in the mid-IR of a transmission mode near-field microscope are studied. It is found that the amount of light propagating from a sub-wavelength aperture through a flat substrate strongly increases the tip nears the same. This effect tends to generate topographic artifacts in near-field images that can be eliminated through the use of flat sample preparation techniques. The transmitted power is strongly influenced by the refractive index of the sample, leading to a substantial difference between a near-field and a far- field spectrum. A phenomenological model, which makes predictions in good agreement with experiment, describing tunneling of light through a sub-wavelength aperture into a substrate is developed. The model predicts spectral sensitivity enhancement with decreasing aperture size.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dmitrii M. Simanovski, Daniel V. Palanker, Philip Huie, and Todd I. Smith "Image formation in near-field infrared microscopy", Proc. SPIE 3922, Scanning and Force Microscopies for Biomedical Applications II, (21 April 2000); https://doi.org/10.1117/12.383347
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KEYWORDS
Near field

Image acquisition

Refractive index

Near field optics

Microscopes

Microscopy

Near field scanning optical microscopy

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