Paper
21 July 2000 Improved theoretical reflectivities of extreme ultraviolet mirrors
Mandeep Singh, Joseph J. M. Braat
Author Affiliations +
Abstract
We show that the theoretical reflectivities of multilayered Mo/Be and Mo/Si extreme ultraviolet (EUV) mirrors tuned for the 11 - 14 nm spectral region can be enhanced significantly by incorporating additional materials within the stack. The reflectivity performance of these quarter-wave multilayers can be enhanced further by global optimization procedures by which the layer thicknesses are varied for optimum performance. By incorporating additional materials of differing complex refractive indices -- e.g. Rh, Ru and Sr -- in various regions of the stack we calculate peak reflectivity enhancements of up to approximately 5% for a single reflector compared to standard unoptimized stacks. For an EUV optical system with nine near-normal-incidence mirrors, the theoretical optical throughput may be increased by up to 100%. We also show that protective capping layers such as Rh and Ru, in addition to protecting the mirrors from environmental attack, may serve to improve the reflectivity characteristics.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mandeep Singh and Joseph J. M. Braat "Improved theoretical reflectivities of extreme ultraviolet mirrors", Proc. SPIE 3997, Emerging Lithographic Technologies IV, (21 July 2000); https://doi.org/10.1117/12.390078
Lens.org Logo
CITATIONS
Cited by 5 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reflectivity

Extreme ultraviolet

Molybdenum

Ruthenium

Strontium

Silicon

Rhodium

Back to Top