Use of beam parameters in optical component testing

Daniel R. Neal; James K. Gruetzner; James P. Roller

doi:10.1117/12.453638

27 December 2001 Use of beam parameters in optical component testing

Daniel R. Neal, James K. Gruetzner, James P. Roller

Proceedings Volume 4451, Optical Manufacturing and Testing IV; (2001) https://doi.org/10.1117/12.453638
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

We are investigating the use of a Shack-Hartmann wavefront sensor for measuring optical component quality during manufacture and testing. In a variety of fields, an optical component is designed to pass an optical signal with minimal distortion. Quality control during the manufacturing and production process is a significant concern. Changes in beam parameters, such as RMS wavefront deviation, or the beam quality parameter M², have been considered as indications of optical component quality. These characteristics can often be quickly determined using relatively simple algorithms and system layouts. A laboratory system has been prepared to investigate the use of a wavefront sensor to measure the quality of an optical component. The instrument provides a simultaneous measure of changes in M² and induced RMS wavefront error. The results of the investigation are presented.

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Daniel R. Neal, James K. Gruetzner, and James P. Roller "Use of beam parameters in optical component testing", Proc. SPIE 4451, Optical Manufacturing and Testing IV, (27 December 2001); https://doi.org/10.1117/12.453638

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