Paper
1 August 2003 Femtosecond streak tubes designing, manufacturing, and testing
Valentina P. Degtyareva, Vladimir S. Belolipetskii, Gennadii I. Bryukhnevich, Svetlana R. Ivanova, Galina P. Levina, Valentina A. Makushina, Nadejda D. Polikarkina, Zoya M. Semichastnova, Mikhail Ya. Schelev
Author Affiliations +
Proceedings Volume 4948, 25th International Congress on High-Speed Photography and Photonics; (2003) https://doi.org/10.1117/12.516876
Event: 25th international Congress on High-Speed photography and Photonics, 2002, Beaune, France
Abstract
New generation of streak tubes intended for single-shot and synchroscan operations with femtosecond time resolution was computer modelled, designed, manufactured, tested and adopted for further application in laser research. The developed PV-FS type tubes provide close to 100 fs-time resolution in single-shot streak mode. It is important to note that the PV-FS tubes may be equipped with Peltier cooled S1-photocathodes and their spectral sensitivity may cover the range of 115 - 1550 nm. The developed photocathodes have very low surface resistance (tens of Ohm per square unit). New tubes offer a high (more than 50 line pairs/mm) spatial resolution when recording ultrafast optical images with femtosecond time resolution. Due to keeping the PV-FS external geometry similar to the well-known PV-type tubes it becomes possible to install new devices into available streak cameras (AGAT, Imacon 500, etc.).
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Valentina P. Degtyareva, Vladimir S. Belolipetskii, Gennadii I. Bryukhnevich, Svetlana R. Ivanova, Galina P. Levina, Valentina A. Makushina, Nadejda D. Polikarkina, Zoya M. Semichastnova, and Mikhail Ya. Schelev "Femtosecond streak tubes designing, manufacturing, and testing", Proc. SPIE 4948, 25th International Congress on High-Speed Photography and Photonics, (1 August 2003); https://doi.org/10.1117/12.516876
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Cited by 8 scholarly publications.
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KEYWORDS
Femtosecond phenomena

Manufacturing

Spatial resolution

Image resolution

Computer simulations

Electrodes

Design for manufacturability

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