Paper
1 May 2003 Vision-based process control in layered manufacturing
Yuan Cheng, Mohsen Jafari
Author Affiliations +
Proceedings Volume 5132, Sixth International Conference on Quality Control by Artificial Vision; (2003) https://doi.org/10.1117/12.515076
Event: Quality Control by Artificial Vision, 2003, Gatlinburg, TE, United States
Abstract
This paper combines defect detection and process control strategy into an efficient vision-based process control system in layered manufacturing. The purpose of our surface inspection, other than monitoring and classification of defects, is to improve the manufacturing process to reduce defects in subsequent stages. We examine the surface pattern using intensity image combined with CAD information. A hybrid strategy is used for defect analysis, where randomly occurred defects are detected by 2D texture analysis and assignable defects are obtained from 3D shape reconstruction using shape-from-shading. Instead of reconstructing the whole 3D surface, our approach reconstructs profile from representative signature(s) using parametric approach. In vision-based process control, we take defect information as input and determine the appropriate control parameter of current stage to minimize the possible defects. A linear model is developed and discussed.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuan Cheng and Mohsen Jafari "Vision-based process control in layered manufacturing", Proc. SPIE 5132, Sixth International Conference on Quality Control by Artificial Vision, (1 May 2003); https://doi.org/10.1117/12.515076
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Roads

Process control

Manufacturing

Computer aided design

Defect detection

Inspection

Visual process modeling

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