Photothermal analysis of submicrometric scale defects in laser damage studies

Mireille Commandre; Caroline Fossati; Jean-Yves Natoli; Claude Amra

doi:10.1117/12.517387

25 February 2004 Photothermal analysis of submicrometric scale defects in laser damage studies

Mireille Commandre, Caroline Fossati, Jean-Yves Natoli, Claude Amra

Proceedings Volume 5250, Advances in Optical Thin Films; (2004) https://doi.org/10.1117/12.517387
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

Laser-induced damage has long been widely acknowledged as a localized phenomenon associated with the presence of defects such as nodules, scratches, fractures, polishing or cleaning residues, impurities, contaminants, metal or dielectric inclusions, etc. Destructive investigations in ultra pure fused silica have led to the conclusion that defects, typically a few nanometers in size, were responsible for laser damage initiation. The understanding of damage phenomena requires the development of more sophisticated, non destructive tools with both high spatial resolution and high sensitivity, to detect defects as small as possible. Photothermal microscopy has been widely employed to characterize optical absorption, thermal properties of optical materials and for mapping defects. This technique has been coupled and compared with scattering mapping for studying laser damage processes before and after irradiation. Furthermore the capability of collinear photothermal deflection to reach sub-micrometric resolution by reduction of the pump beam diameter has been theoretically explored and experimentally demonstrated on specially prepared absorbing targets. A photothermal microscope based on photothermal deflection of the transmitted beam and well-suited for multi-scale studies of absorbing defects in thin films has been coupled with an experimental set-up allowing damage threshold measurement at the same wavelength. We present an overview of these developments in the field of photothermal microscopy and scattering mapping in connection with laser damage.

Citation Download Citation

Mireille Commandre, Caroline Fossati, Jean-Yves Natoli, and Claude Amra "Photothermal analysis of submicrometric scale defects in laser damage studies", Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); https://doi.org/10.1117/12.517387

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available