Paper
7 April 2004 Optical parameter adjustment for silica nano- and micro-particle size distribution measurement using Mastersizer 2000
Ales Sliva, Andrea Samolejova, Robert Brazda, Jiri Zegzulka, Jaromir Polak
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Proceedings Volume 5445, Microwave and Optical Technology 2003; (2004) https://doi.org/10.1117/12.558761
Event: Microwave and Optical Technology 2003, 2003, Ostrava, Czech Republic
Abstract
This paper deals with adjustment of certain optical parameters of nano and micro-structured particles of silica by which Mastersizer 2000 as a device for size distribution particle measurement has been used. The optical method process may be used by looking for unique refractive and absorption index of investigated particles. Optical properties, i.e. refractive index and absorption index of the silica have been found and related to inter-particle silica bindings in the form of Hamaker constants. For the optical properties calculations using the Mastersizer 2000 Mie Scattering solutions representing the electric and magnetic induction, i.e. silica's permeability and permittivity from Maxwell's equations have been exercised.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ales Sliva, Andrea Samolejova, Robert Brazda, Jiri Zegzulka, and Jaromir Polak "Optical parameter adjustment for silica nano- and micro-particle size distribution measurement using Mastersizer 2000", Proc. SPIE 5445, Microwave and Optical Technology 2003, (7 April 2004); https://doi.org/10.1117/12.558761
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Cited by 4 scholarly publications.
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