Paper
6 February 2008 New approach for antireflective fused silica surfaces by statistical nanostructures
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Abstract
In this work we present a new technique in order to create antireflective surfaces with the help of statistical nanostructures on fused silica. A specific plasma etching process was found to serve this purpose, as thereby nanostructures are created through self-masking. Under specific etching conditions the micro-contaminations create pillars on the surface with dimensions down to 20 nm, which act as an antireflective nanostructure. Those structures raise the transmission of fused silica in the wavelength range from 370 nm to 500 nm to more than 99.5% (both sides etched). Within the close UV range (from 200 nm up to 400 nm) the transmission can be raised by 4.8% to 97.1% on average.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Schulze, H.-J. Fuchs, E.-B. Kley, and A. Tünnermann "New approach for antireflective fused silica surfaces by statistical nanostructures", Proc. SPIE 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics, 68830N (6 February 2008); https://doi.org/10.1117/12.767778
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CITATIONS
Cited by 19 scholarly publications.
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KEYWORDS
Etching

Antireflective coatings

Silica

Aluminum

Reflection

Nanostructures

Oxygen

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