Application of MEMS blazed gratings in WDM

Yongfeng Wu; Honglin Yu; Zhiping Kang

doi:10.1117/12.832071

18 May 2009 Application of MEMS blazed gratings in WDM

Yongfeng Wu, Honglin Yu, Zhiping Kang

Proceedings Volume 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; 72840D (2009) https://doi.org/10.1117/12.832071
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

For the shortage and limitation of ruled grating that have ghost lines and stray light because of period error and ruling irregularity, a method for making a wavelength division multiplexer (WDM) based on Micro Electro-Mechanical System (MEMS) blazed grating is proposed. The basic composition of WDM based on MEMS blazed grating is introduced according to the method. The process realizing MEMS blazed grating and means for improving diffraction efficiency are also introduced. MEMS blazed grating is numerical simulated and analyzed in laboratory virtual instrument engineering workbench (LabVIEW), the diffraction intensity distribution of blazed grating is presented, it is shown that the blazed grating, period is 2000nm and blazed angle is 20 degree, have the best division effect for light wave with wavelength about 1.55μm by the results. At the same time, the 3D layout of WDM is provided in ZEMAX, and the rays in WDM are traced also. It is indicated by the results when the channel spacing is greater than or equal to 50nm, the division effect is in evidence. It achieves the capability of Coarse Wavelength Division Multiplexing (CWDM). It is proved that MEMS blazed grating can be applied well in WDM by all the results.

Citation Download Citation

Yongfeng Wu, Honglin Yu, and Zhiping Kang "Application of MEMS blazed gratings in WDM", Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 72840D (18 May 2009); https://doi.org/10.1117/12.832071

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available