Paper
14 May 2010 Novel approach to estimate fringe order in Moire profilometry
Author Affiliations +
Abstract
A novel approach to estimate fringe order in Moire topography is proposed. Along with the light source used to create shadow of the grating on the object (as in conventional moiré), proposed method uses a second light source which illuminates the object with color bands from the side. Width of each colored band is set to match that height which leads to a 2π phase shift in moiré fringes. This facilitates one to rule the object with colored bands, which can be used to estimate fringe order using a color camera with relatively low spatial resolution with out any compromise in height sensitivity. Current proposal facilitates one to extract 3D profile of objects with surface discontinuities. It also deals with the possible usage of moiré topography (when combined with the proposed method) in extracting 3D surface profile of many objects with height discontinuities using a single 2D image. Present article deals with theory and simulations of this novel side illumination based approach.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mahesh Kondiparthi "Novel approach to estimate fringe order in Moire profilometry", Proc. SPIE 7690, Three-Dimensional Imaging, Visualization, and Display 2010 and Display Technologies and Applications for Defense, Security, and Avionics IV, 769014 (14 May 2010); https://doi.org/10.1117/12.858620
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Light sources

3D image processing

Cameras

Moire patterns

Spatial resolution

RGB color model

Denoising

RELATED CONTENT

Color Encoded Moire Contouring
Proceedings of SPIE (March 07 1989)
Assigning fringe order in moire profilometry using colors
Proceedings of SPIE (September 24 2011)
Limits of tomographic depth estimation
Proceedings of SPIE (February 29 2000)
Machine vision method for small feature measurements
Proceedings of SPIE (December 16 2004)

Back to Top