Modeling the ultrafast optical response of a multilayered sample subject to transient distributed perturbations

Denis Mounier; Jean-Marc Breteau; Pascal Picart; Vitalyi Gusev

doi:10.1117/12.889557

23 May 2011 Modeling the ultrafast optical response of a multilayered sample subject to transient distributed perturbations

Denis Mounier, Jean-Marc Breteau, Pascal Picart, Vitalyi Gusev

Author Affiliations +

Proceedings Volume 8083, Modeling Aspects in Optical Metrology III; 808317 (2011) https://doi.org/10.1117/12.889557
Event: SPIE Optical Metrology, 2011, Munich, Germany

Abstract

A method for simulating the transient optical response of a multilayered sample subject to a spatially and temporally varying field distribution is presented. The transient optical response of a sample probed in the reflection configuration, is characterized by the 2x2 Jones transient reflection matrix: ▵R(t)-R^-1 (TRM). Signals in transient reflectometry, interferometry, and polarimetry measurements can be readily extracted from the TRM. A matrix formalism based on 4x4 transfer matrix is used for calculating the TRM. The formalism facilitates the simulation of transient phenomena in anisotropic stratified samples in the presence of non-homogeneous perturbing fields like electric, magnetic, and strain fields. Various areas of experimental research may benefit of this matrix formalism: picosecond acoustics, electro-optic sampling, magneto-optic sampling, and others area of research involving fast/ultrafast phenomena in multilayered samples studied with the pump-probe technique.

Citation Download Citation

Denis Mounier, Jean-Marc Breteau, Pascal Picart, and Vitalyi Gusev "Modeling the ultrafast optical response of a multilayered sample subject to transient distributed perturbations", Proc. SPIE 8083, Modeling Aspects in Optical Metrology III, 808317 (23 May 2011); https://doi.org/10.1117/12.889557

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