Paper
19 March 2012 Positive-tone chemically amplified fullerene resist
J. Manyam, A. Frommhold, D. X. Yang, A. McClelland, M. Manickam, J. A. Preece, R. E. Palmer, A. P. G. Robinson
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Abstract
With continuing efforts to achieve higher lithographic resolution there has been on-going interest in the development of low molecular weight resists, such as molecular glasses. Here we present the initial results of a study into the development of a positive tone two component chemically amplified resist based on methanofullerene derivatives (MF) with acid labile groups (tert-butyl acetate (tBAC); tert-butoxycarbonyl (tBOC)). Mono, di, tris and hexa adducts of MFtBAC together with mono and di adducts of MF-tBOC have been evaluated with several photoacid generators. Sensitivities as high as 11 μC/cm2 have been achieved in some cases and sub-100 nm features have been patterned.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Manyam, A. Frommhold, D. X. Yang, A. McClelland, M. Manickam, J. A. Preece, R. E. Palmer, and A. P. G. Robinson "Positive-tone chemically amplified fullerene resist", Proc. SPIE 8325, Advances in Resist Materials and Processing Technology XXIX, 83251U (19 March 2012); https://doi.org/10.1117/12.916472
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Cited by 8 scholarly publications.
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KEYWORDS
Magnesium

Fullerenes

Optical lithography

Silica

Chromatography

Nitrogen

Solids

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