Optical Characterization Of Integrated Optical Devices

Dan Courtney; Tim Bailey

doi:10.1117/12.942356

10 March 1988 Optical Characterization Of Integrated Optical Devices

Dan Courtney, Tim Bailey

Proceedings Volume 0835, Integrated Optical Circuit Engineering V; (1988) https://doi.org/10.1117/12.942356
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States

Abstract

As integrated optical components become increasingly available, the need for an understanding of methods for characterization of these devices becomes necessary. This paper discusses several techniques for characterization of Ti:LiNb0₃ devices including waveguides, polarizers and phase modulators. Measurement aspects common to all devices are discussed such as polarization requirements, wavelength, power restrictions and power measurement. In addition, specific techniques for measurement of optical loss, fiber to chip coupling, optical retardation and polarization extinction are given.

Citation Download Citation

Dan Courtney and Tim Bailey "Optical Characterization Of Integrated Optical Devices", Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); https://doi.org/10.1117/12.942356

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