Paper
18 September 2014 Metrology research on PDMS phantoms for evaluating resolution performance of OCT systems
Bingtao Hao, Wenli Liu, Zhixiong Hu, Baoyu Hong, Jiao Li
Author Affiliations +
Proceedings Volume 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 92820H (2014) https://doi.org/10.1117/12.2068500
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China
Abstract
Imaging resolution, an important performance parameter of OCT systems, can be evaluated by suitable point spread function (PSF) phantoms. In this paper, we propose an innovative method to prepare PSF phantoms by mixing polystyrene microspheres of standard sizes with transparent polymer - polydimethylsiloxane (PDMS). Detailed procedures as well as specific design are described, and the produced PSF phantoms are employed to verify OCT system resolution performance by analyzing corresponding point spread functions. For comparison, images of the standard-size microspheres are provided by measuring the PSF phantoms with optical microscope.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bingtao Hao, Wenli Liu, Zhixiong Hu, Baoyu Hong, and Jiao Li "Metrology research on PDMS phantoms for evaluating resolution performance of OCT systems", Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92820H (18 September 2014); https://doi.org/10.1117/12.2068500
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Cited by 1 scholarly publication.
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KEYWORDS
Point spread functions

Optical coherence tomography

Silicon

Particles

Metrology

Solids

Surface finishing

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