Journal of Micro/Nanolithography, MEMS, and MOEMS

Journal of Micro/Nanolithography, MEMS, and MOEMS

The Journal of Micro/Nanolithography, MEMS, and MOEMS (JM3) publishes papers on the science, development, and practice of lithographic, fabrication, packaging, and integration technologies necessary to address the needs of the electronics, MEMS, MOEMS, and photonics industries. The wide range of such devices includes biomedical microdevices, microfluidics, sensors and actuators, adaptive optics, and digital micromirrors. The scope is broad to facilitate synergy and interest between the communities served by the journal.

Featured Articles


Fabrication of three-dimensional and submicrometer-scaled microstructures based on metal contact printing and silicon bulk machining

Kuo-Lun Kao, Cho-Wei Chang, Yung-Chun Lee

 

 

 



Fundamental study of placement errors in directed self-assembly

Sander F. Wuister, Davide Ambesi, Tamara S. Druzhinina, Emiel Peeters, Jo Finders, Joanne Klein Wolterink, Johannes G. E. M. (Hans) Fraaije

 

 

Top Downloads from Journal of Micro/Nanolithography, MEMS, and MOEMS

Editor-in-Chief

Chris A. Mack
  • Lithoguru.com

About the Journal


Scope:

Topical areas covered include:

Lithography: tools, materials, and processes associated with the patterning of structures that have submicrometer and nanometer-scale features. Included are imaging and nonimaging approaches using optics, electron and other particle beams, nanoimprint, molecular self-assembly, and their hybrids. Applications include semiconductor fabrication, but also patterning for other micro/nanodevices.

Microelectromechanical systems (MEMS): the design, fabrication, operation, reliability, and testing of microdevices that contain both electrical and mechanical elements.

Micro-optoelectromechanical systems (MOEMS): the design, fabrication, operation, reliability, and testing of microdevices that contain electrical, mechanical, and optical elements (that is, the merging of micro-optics and MEMS).

Microfabrication: technologies to shape three-dimensional structures leading to the fabrication of active and passive electronics, photonics, MEMS, MOEMS, micro/nano-optics, and other micro/nanodevices.

Metrology: metrology and process control for the above devices and their fabrication processes.

ISSN: 1932-5150
E-ISSN: 1932-5134
Frequency: Quarterly
Indexed in:
  • Science Citation Index Expanded
  • Current Contents - Physical, Chemical & Earth Sciences
  • Current Contents - Engineering, Computing & Technology
  • Inspec
  • Scopus
  • Ei Compendex
  • Chemical Abstracts

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