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JM3 Associate Editor Qinghuang Lin interviews Wen-li Wu, retired from the National Institute of Standards and Technology. With R. Joseph Kline, Ronald L. Jones, Hae-Jeong Lee, Eric K. Lin, Daniel F. Sunday, Chengqing Wang, Tengjiao Hu, and Christopher L. Soles, Wu is the lead author of “ Review of the key milestones in the development of critical dimension small angle x-ray scattering at National Institute of Standards and Technology,” a review paper in the Special Section on 3D Metrology in the July–September 2023 issue of the Journal of Micro/Nanopatterning, Materials, and Metrology. |
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