Hang Du
at Hitachi Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 May 2022 Poster + Paper
Proceedings Volume 12053, 120531Y (2022) https://doi.org/10.1117/12.2613955
KEYWORDS: Scanning electron microscopy, Neural networks, Monte Carlo methods, Sensors, Evolutionary algorithms, Computer simulations, Image processing, Algorithm development, Visibility, Convolutional neural networks

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top