Dr. Naoki Fujiwara
at NTT Device Technology Labs
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 February 2020 Paper
T. Shindo, N. Fujiwara, Y. Ohiso, T. Sato, H. Matsuzaki
Proceedings Volume 11301, 113010S (2020) https://doi.org/10.1117/12.2543101
KEYWORDS: Wavelength tuning, Refractive index, Tunable lasers, Light sources

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