Nikhila Mahadevapuram
PTD Module and Integration Device Yield Engineer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 March 2015 Paper
Proceedings Volume 9423, 942320 (2015) https://doi.org/10.1117/12.2085676
KEYWORDS: Polymethylmethacrylate, Interfaces, Scattering, Annealing, Thin films, Silicon, Lithography, Picosecond phenomena, Scanning electron microscopy, Microscopy

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top