Sam Sivakumar
Director of Lithography at Intel Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 March 2016 Open Access Paper
Proceedings Volume 9776, 977602 (2016) https://doi.org/10.1117/12.2225014
KEYWORDS: Extreme ultraviolet, Reticles, Pellicles, Photomasks, Semiconducting wafers, Extreme ultraviolet lithography, Scanners, Optical lithography, Inspection, Yield improvement

Proceedings Article | 29 March 2006 Paper
David Fryer, Vivek Singh, Andrew Muray, Sushil Dhoot, Sam Sivakumar
Proceedings Volume 6153, 61530U (2006) https://doi.org/10.1117/12.658060
KEYWORDS: Stereolithography, Lithography, Optical lithography, Photomasks, FT-IR spectroscopy, Data modeling, Resolution enhancement technologies, Reticles, Model-based design, Photoresist materials

Conference Committee Involvement (8)
Optical Microlithography XXVIII
24 February 2015 | San Jose, California, United States
Optical Microlithography XXVII
25 February 2014 | San Jose, California, United States
Optical Microlithography XXVI
26 February 2013 | San Jose, California, United States
Optical Microlithography XXV
14 February 2012 | San Jose, California, United States
Optical Microlithography XXIV
1 March 2011 | San Jose, California, United States
Showing 5 of 8 Conference Committees
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