See-Ho Tsang
at Simon Fraser Univ
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 1 April 2008
Ian Foulds, Robert Johnstone, See-Ho Tsang, M. Pallapa
JM3, Vol. 7, Issue 02, 023003, (April 2008) https://doi.org/10.1117/12.10.1117/1.2909468
KEYWORDS: Deep ultraviolet, Data modeling, Semiconducting wafers, Microelectromechanical systems, Absorbance, Absorption, Polymers, Etching, Standards development, Wafer-level optics

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